Event Detail
Session: 20:Reliable Design and CAD Solutions for Circuit Aging
Type: Regular Session
Track: Interconnect and Reliability
Day:
Wednesday
Time: 8:30 AM - 10:00 AM
Room: 6A
Chair: Marek Patyra - Intel
20.1 Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement, K. Kang, K. Kim, A. Islam, M. Alam, K. Roy - Purdue
20.2 The Impact of NBTI on the Performance of Combinational and Sequential Circuits, W. Wang - Arizona State Univ., S. Yang - Peking Univ., S. Bhardwaj, R. Vattikonda, S. Vrudhula - Arizona State Univ., F. Liu - IBM
Yu Cao - Arizona State Univ., Tempe, AZ
20.3 NBTI-Aware Synthesis of Digital Circuits, S. Kumar, C. Kim, S. Sapatnekar - Univ. of Minnesota
Abstract: Negative-Bias-Temperature-Instability emerges as the prominent factor for circuit performance degradation. This session consists of three papers to address the design for circuit reliability. The first paper presents the application of IDDQ measurement to diagnose the reliability under NBTI. A comprehensive understanding of NBTI is provided in the second paper, for both combinational and sequential circuits. The third paper incorporates NBTI models into the synthesis of digit circuits. These approaches will ensure the lifetime of circuit operation under increasingly severe NBTI.
